Pages that link to "Q39778483"
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The following pages link to Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolution (Q39778483):
Displaying 10 items.
- Invited review article: Methods for imaging weak-phase objects in electron microscopy (Q28661264) (← links)
- Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope (Q35018190) (← links)
- Advanced double-biprism holography with atomic resolution (Q35201729) (← links)
- Advanced electron microscopy for advanced materials (Q38036191) (← links)
- Electron holography for fields in solids: problems and progress (Q48945287) (← links)
- Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping (Q51299840) (← links)
- Quantitative determination of elastic and inelastic attenuation coefficients by off-axis electron holography. (Q54292933) (← links)
- In Situ Transmission Electron Microscopy of Ionic Conductivity and Reaction Mechanisms in Ultrathin Solid Oxide Fuel Cells (Q57388899) (← links)
- Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography (Q57389042) (← links)
- The Dresden in-situ (S)TEM special with a continuous-flow liquid-helium cryostat (Q92560972) (← links)