Depth profiling of organic films with X-ray photoelectron spectroscopy using C60 and Ar co-sputtering (Q80920769)
Jump to navigation
Jump to search
scientific article published on 21 March 2008
Language | Label | Description | Also known as |
---|---|---|---|
English | Depth profiling of organic films with X-ray photoelectron spectroscopy using C60 and Ar co-sputtering |
scientific article published on 21 March 2008 |
Statements
Depth profiling of organic films with X-ray photoelectron spectroscopy using C60 and Ar co-sputtering (English)
Bang-Ying Yu
Ying-Yu Chen
Wei-Ben Wang
Mao-Feng Hsu
Shu-Ping Tsai
Wei-Chun Lin
Yu-Chin Lin
Jwo-Huei Jou
Chih-Wei Chu
Jing-Jong Shyue