Model based on trap-assisted tunneling for two-level current fluctuations in submicrometer metal-silicon-dioxide-silicon diodes (Q78192482)
Jump to navigation
Jump to search
scientific article published on 01 May 1990
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Model based on trap-assisted tunneling for two-level current fluctuations in submicrometer metal-silicon-dioxide-silicon diodes |
scientific article published on 01 May 1990 |
Statements
Model based on trap-assisted tunneling for two-level current fluctuations in submicrometer metal-silicon-dioxide-silicon diodes (English)
Andersson MO
Xiao Z
Norrman S
1 reference
1 reference
1 reference
1 reference