Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval (Q63958057)
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article published in 2006
Language | Label | Description | Also known as |
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English | Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval |
article published in 2006 |
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Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval (English)
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11 October 2006
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86
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29-31
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4589-4606
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