Growth of Ge Microcrystals in SiO2Thin Film Matrices: A Raman and Electron Microscopic Study (Q62495751)
Jump to navigation
Jump to search
No description defined
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Growth of Ge Microcrystals in SiO2Thin Film Matrices: A Raman and Electron Microscopic Study |
No description defined |
Statements
Growth of Ge Microcrystals in SiO2Thin Film Matrices: A Raman and Electron Microscopic Study (English)
0 references
15 April 1991
0 references
30
0 references
Part 1, No. 4
0 references
687-694
0 references