A switch from high-fidelity to error-prone DNA double-strand break repair underlies stress-induced mutation. (Q54478818)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A switch from high-fidelity to error-prone DNA double-strand break repair underlies stress-induced mutation. |
scientific article |
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A switch from high-fidelity to error-prone DNA double-strand break repair underlies stress-induced mutation (English)
Rebecca G Ponder
Susan M Rosenberg
1 September 2005