New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors. (Q52904578)
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scientific article published on 28 December 2009
Language | Label | Description | Also known as |
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English | New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors. |
scientific article published on 28 December 2009 |
Statements
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors. (English)
Chung-Kai Fang
Yusaku Yamada
Yoshiaki Sugimoto
Masayuki Abe
Seizo Morita
28 December 2009
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