Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping (Q51299840)
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scientific article published on 10 September 2012
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping |
scientific article published on 10 September 2012 |
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Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping (English)
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Y Y Wang
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J Li
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A Domenicucci
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J Bruley
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10 September 2012
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124
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117-129
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