Beam damage to organic material is considerably reduced in cryo-electron microscopy (Q41636575)
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scientific article published on August 1980
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English | Beam damage to organic material is considerably reduced in cryo-electron microscopy |
scientific article published on August 1980 |
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Beam damage to organic material is considerably reduced in cryo-electron microscopy (English)
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Knapek E
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Dubochet J
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1 August 1980
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141
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2
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147-161
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