Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis (Q34095939)
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scientific article published on December 8, 2011
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis |
scientific article published on December 8, 2011 |
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Characterization of surface stiffness and probe-sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis (English)
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Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis (English)
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Santiago D. Solares
Adam U. Kareem
8 December 2011
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015706
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Weisstein E W
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