Metal imaging on surface of micro- and nanoelectronic devices by laser ablation inductively coupled plasma mass spectrometry and possibility to measure at nanometer range (Q33409246)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Metal imaging on surface of micro- and nanoelectronic devices by laser ablation inductively coupled plasma mass spectrometry and possibility to measure at nanometer range |
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Metal imaging on surface of micro- and nanoelectronic devices by laser ablation inductively coupled plasma mass spectrometry and possibility to measure at nanometer range (English)
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Myroslav V Zoriy
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J Sabine Becker
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18 January 2009
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20
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883-890
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