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Capture even the smallest details with C16506-01, our Dual PHEMOS-X Emission Microscope! ☑️ Exceptional precision ☑️ Advanced imaging capabilities ☑️ Dual-mode functionality for comprehensive examination Discover how it can enhance your defect detection and analysis: https://ow.ly/2CyU50SqT6m #FailureAnalysis #Semiconductormanufacturing

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Edward Herniak

Director of Engineering - Photodiode Reliability Testing

2mo

Impressive precision and dual-mode functionality—ideal for detailed defect detection and analysis! We just fulfilled an order for a photodiode test equipment for 64 diodes for a US government application, would be great to connect in case you have any need for reliability test equipment. Sent you an invite to connect.

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