GDOES is an analytical technique that provides ultra-fast elemental depth profile analysis of layered materials, simultaneously offering quantitative measurement of all elements and thickness with nanometer depth resolution. HORIBA Scientific's pulsed RF GDOES instruments, with Differential Interferometry Profiling (DiP), are the ideal companion characterization tools for material research and process elaboration.
The innovative pulsed RF source allows profiling of all types of solid samples with optimum performance, from the first nanometer, to more than 150µm. Polymeric materials are easily sputtered with patented Ultra Fast Sputtering (UFS). In addition, this source can also be used to prepare sample surfaces for Scanning Electron Microscopy (SEM).
All elements can be measured, including Hydrogen, Deuterium, Lithium, Carbon, Nitrogen, Oxygen, and more.
The patented Differential Interferometry Profiling (DiP) allows direct measurement of the depth as a function of time, with nanometric precision, which is performed simultaneously with the GD analysis.
The patented High Dynamic range Detectors (HDD) used in all HORIBA Scientific GD instruments, allow real time, automatic optimization of the sensitivity, to analyze elements at trace levels in one layer, and as major in a second layer without compromise or need to make any adjustments.
The combination between pulsed GD OES and XPS, notably to look at embedded interfaces, is generating interest from the Surface community. Look at this open Access article published in Coatings.
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Discover the new brochure for the GD-Profiler 2™, our Pulsed RF Glow Discharge Optical Emission Spectrometer, with Differential Interferometry Profiling (DiP) information and the latest functionalities and applications.
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In this paper, the characteristics of new porous coatings fabricated at three voltages in electrolytes based on H3PO4 with calcium nitrate tetrahydrate, magnesium nitrate hexahydrate, and copper(II) nitrate trihydrate are presented. The SEM, energy dispersive spectroscopy (EDS), glow discharge optical emission spectroscopy (GDOES), X-ray photoelectron spectroscopy (XPS), and XRD techniques for coating identification were used.
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We developed an in situ measurement technique implemented on a Glow Discharge Optical Emission Spectrometry (GDOES) instrument, which provides the depth information during the profiling process. The setup is based on a differential interferometer, and we show that a measurement accuracy better than 5% can be obtained for crater depths ranging from 100 nanometers to several tens of micrometers. This development can be directly applied to non-transparent coatings, and brings significant improvement to the quantification process in GDOES.
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With their ~20 % efficiency, hybrid perovskite solar cells are the new promising candidate for next generation photovoltaics. Thanks to the wide HORIBA Scientific portfolio, different techniques can be used to gain in depth knowledge on the optoelectronic properties and mechanisms of this class of materials. In this application note we decided to use spectroscopic ellipsometry, steady-state and time-resolved fluorescence and Glow Discharge Optical Emission Spectroscopy to investigate the properties of CH3NH3PbI3 thin films deposited on a spin-coated PEDOT:PSS. The impact of the exposure to air was addressed.
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Pulsed RF Glow Discharge Optical Emission Spectrometry offers ultra-fast elemental depth profiling capability for the investigation of thin and thick films. Thanks to the use of a pulsed RF source, coupled with a high resolution optical spectrometer, the GD Profiler 2 provides an excellent depth resolution, allowing the fast evaluation of the coating quality. In this application note, we focus on a MoS2/Pb composite multilayered sample, used as a solid lubricant. The analysis of such a sample shows the excellent performance of this instrument for the study of nm-thick complex coatings.
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Pulsed-RF Glow Discharge Optical Emission Spectrometer
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