256 × 256 points simultaneously acquired topography image (right) and composite Raman map (left) of graphene.
Raman and AFM (Atomic Force Microscope) analysis can be combined on a single microscope system, opening interesting new capabilities and providing enhanced information on sample composition and structure by collecting physical and chemical information on the same sample area. Co-localized AFM-Raman measurement is the sequential or simultaneous acquisition of overlapped SPM (Scanning Probe Microscope) and Raman maps with pixel-to-pixel correspondence in the images.
On one hand, AFM and other SPM techniques like STM, Shear-Force or Normal-Force, provide topographic, mechanical, thermal, electrical, and magnetic properties down to the molecular resolution (~ nm, over μm2 area), on the other hand confocal Raman spectroscopy and imaging provides specific chemical information about the material, with diffraction limited spatial resolution (sub-micron).