Product name | Continuous Particulate Monitor with X-ray Fluorescence |
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Model | PX-375 |
Measured object | Particulate matter (PM10, PM2.5, TSP) |
Measurement content | Particulate mass concentration and element concentration |
Common
Flow rate | 16.7 L/min |
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Sampling pump | Linear drive system, externally installed |
Filter tape | None-woven PTFE fabric filter |
Spot tape interval | 20 / 25 / 50 / 100mm selectable |
Filter tape replacement interval | Approx. 5 months (In case of 20 mm spot interval, 1 hour sampling time) |
Ambient operation temperature | 10˚C~30˚C |
Relative humidity | 0~80% RH noncondensing |
Altitude | 1000m or less |
Power supply | AC100V~240V ±10%, 50/60Hz±1% |
Power consumption | Approx. 400VA |
External dimension | 430mm(W)×550mm(D)×285mm(H) (without sampling pipe and measurement head) |
Weight | Approx. 49kg |
Data output | CSV file (Average PM mass and elemental concentration) |
External connection | EthernetTM, USB, RS-232C* (option) |
*Please consult about communication and instrument composition separately.
Mass analyzer unit
Measurement method | Beta-ray attenuation |
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PM10 | US EPA Louvered PM10 Inlet |
PM2.5 | BGI VSCCTM Cyclone |
TSP | TSP Inlet |
Measurement range | 0~200 / 500 / 1000 μg/m3 |
Repeatability | ±2% (against reference foil value) |
Span drift | ±3 % (24h) |
Lowest detection limit (2σ) | ±4 μg/m3 (24h) |
Sampling and measurement cycle | 0.5 / 1 / 2 / 3 / 4 / 6 / 8 / 12 / 24 hours |
Element analyzer unit
Measurement method | Energy dispersive X-ray fluorescence spectrometry |
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Detectable elements | See Table 1 "Detectable Elements". 32 standard parameters: Al, Si, S, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Rb, Sr, Zr, Pb, Ga, Ge, Y, Pd, Ag, In, Sn, Sb, Te, Cs, Ce, Bi |
Primary X-ray filter | Automatic switching for light metals/heavy metals |
Tube voltage | Automatic switching for 15kV/50kV |
Detector | SDD (Silicon Drift Detector) |
Sample image | CMOS camera |
Lowest detection limit (2σ) | See Table 2 "Lowest Detection Limit (Example)" |
Measurement range | depends on measurement time |
Analysis time | 100 / 200 / 500 / 1000 / 2000 / 5000 / 10000s selectable |
Calibration material for X-ray intensity for standard parameter | NIST SRM 2783, other materials (option) |
Safety functions for X-ray | Internal lock system Key switch X-ray indication light |
Black Particles
Measurement method | Energy dispersive X-ray fluorescence spectrometry |
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Measured object | Particulate matter of black color |
Detector | CMOS camera |
Light source | LED |
BP measurement range | 0-200 |
Lowest Detection Limit | <5 BP value |
Span drift | BP value: ±2% (24 h) |
Spot tape interval | 25 mm only |
Sampling cycle | Follow the setting of mass and element measurement |
Repeatability | ±2% of full scale (Typical), ±3% of full scale (Max) |
Calibration material | Neutral density filter |