MESA-50

X-Ray Fluorescence Analyzer

Perfect Blend of Portability, Safety, Convenience and Efficiency

HORIBA MESA-50 Series is a portable benchtop energy dispersive X-ray fluorescence (EDXRF) analyzer with ultimate user-friendly operation. It achieves a super compact footprint without compromising X-ray safety thanks to the X-ray shields compliant with IEC 61010-1/JAIMAS 0101-2001. Thanks to the built-in battery and a pump-less optics, it enables you to perform your measurement wherever you like!

Portability at Its Best: Built-in battery allows you to take it anywhere with ease
Enhanced Safety: Rest assured of safety with X-ray shields protecting you
Convenient Design: Ease with the LN2-less and pump-less optics
Efficient Operations: Save time and effort with fast and straightforward operations

* This product is available in all the regions expect the EU and the UK.
* For your larger samples, we also offer the MESA-50K Large Sized Chamber model.

Segment: Scientific

Division: X-Ray Fluorescence Spectroscopy

Manufacturing Company: HORIBA, Ltd.

Powerful Hardware

Achieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.

Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
Multiple Primary X-ray filters: Enhance S/N by cutting off background
Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
Silicon drift detector: Achieve high performance without liquid nitrogen

MESA-50 hardware (left) and the optic design diagram (right)

Simple Operation

Set the sample on the measurement window of MESA-50
Press "Measurement Start" button in the software
While the measurement, the red X-RAY ON lamp turns on
The measurement results are shown in the software
Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats

We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.

Optional Software Modules

RoHS module
The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
As/Sb module
The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
Multilayer FPM module
The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.

*MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method.

Wide Range Applications

Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
Metals: Steel plating thickness analysis; Plating solution analysis; Precious metal plating analysis.
Energy: Material characterization; Pt loading mass determination of fuel cell
Enviroment : Hazardous elements in Soil
Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
Food : Defect analysis; Chlorine detemination in soy source
Metal：Material screening identification
Material: Harzardous elements in Toys
Forensic: On-site trace evidence identification
Educational purpose: Scientific class in schools.

Publication

Basic Items	Principle	Energy dispersive X-ray fluorescence spectrometry
	Target application	RoHS, ELV, Halogen Free
	Meas. Elements	13Al - 92U
	Sample type	Solid, Liquid, Powder
X-ray generator	X-ray tube	Max 50kV, 0.2mA
	X-ray irradiation size	1.2mm, 3mm, 7mm (Automatic switching)
	X-ray primary filter	4 types (Automatic switching)
Detector	Type	SDD (Silicon Drift Detector)
Detector	Signal processor	Digital pulse processor
Sample chamber	Atmosphere	Air
Sample chamber	Sample observation	CCD camera
Utility	Operation	PC (Windows^® 7)
	Power supply	AC adapter (100-240V, 50/60Hz)
	Power supply	Battery

We obtained lithium-ion battery cells from 3 different commercial electric vehicles manufactured by an automotive company for the reverse engineering investigation. We disassembled and analyzed each of the cathode sheets, the anode sheets, and the separator sheets using multiple analytical instruments.

We introduce a fast and non-destructive method for Pt catalyst loading mass determination in catalyst sheet of proton exchange membrane fuel cell using a benchtop EDXRF analyzer. We made a calibration curve by analyzing multiple in-house samples with different Pt loading masses (0.052 - 0.39 mg/cm2) and determined catalyst loading mass of a sample using the curve. Our result showed that the curve had a good linearity and that the calculated result was consistent with the labeled value of the sample with good repeatability.

Steel coating plays an important role in preventing corrosion of steel samples. Therefore, an understanding of coatings can help in improving the steel properties. XRF is a powerful technique for measuring thickness and composition of coatings. We carried out non-destructive thickness and composition analysis of Zinc-Nickel coating on steel using the MESA-50 X-ray fluorescence analyzer.

The EDXRF technique is used for the elemental analysis not only of solids, but also of liquids such as plating solution thanks to dedicated sample cells. This specific example shows the ability of MESA-50 for electrolytic baths follow-up by characterizing the degradation of Zn-Ni galvanization baths.

A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.

How to quantify GDOES depth profile data using XRF

Size: 0.92 MB

Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF