AFM-Raman for Physical and Chemical imaging
Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.
Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
Multi-sample analysis platform
Macro, micro and nano scale measurements can be performed on the same platform.
Ease-of-use
Fully automated operation, start measuring within minutes, not hours!
True confocality
High spatial resolution, automated mapping stages, full microscope visualization options.
High collection efficiency
Top-down and oblique Raman detection for optimum resolution and throughput in both
co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).
High spectral resolution
Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis for Raman and PL.
High spatial resolution
Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced
Optical Spectroscopies (Raman and PhotoLuminescence).
Multi-technique / Multi-environment
Numerous SPM modes including AFM, conductive and electrical modes (cAFM,
KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping
through TERS/TEPL. Full control of the 2 instruments through one workstation and a powerful software control, SPM and spectrometer can be operated simultaneously or independently
Robustness/Stability
High resonance frequency AFM scanners, operation far away from noises! High
performance is obtained without active vibration isolation.
Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)
Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %
Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth
Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)
X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm
Sample size: Maximum 40 x 50 mm, 15 mm thickness
Sample positioning: Motorized sample positioning range 5 x 5 mm
Positioning resolution: 1 µm
Laser wavelength: 1300 nm, non-interfering with spectroscopic detector
Alignment: Fully automated cantilever and photodiode alignment
Probe access: Free access to the probe for additional external manipulators and probes
Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)
Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes
Tip-EnhancedPhotoluminescence (TEPL)
Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
Current range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software
Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously
Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm
Fully automated XploRA Plus compact micro-spectrometers, functional as stand-alone micro-Raman microscope
Wavelength range: 60 cm-1 to 4000 cm-1
Gratings: 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)
Automation: Fully motorized, software controlled operation
Full range of CCD detectors and EMCCDs.
Typical wavelength: 532 nm, 638 nm, 785 nm.
Automation: Fully motorized, software controlled operation
Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.
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