𝗛𝗼𝘄 𝘀𝗮𝗳𝗲 𝗮𝗿𝗲 𝘆𝗼𝘂𝗿 𝘀𝗮𝗺𝗽𝗹𝗲𝘀? Decapsulation using Microwave-Induced Plasma (MIP) selectively removes only the required materials, ensuring no damage to the sample. Preserve crucial failure evidence with our purely chemical process. Discover all the benefits of MIP technology by downloading our whitepaper: https://lnkd.in/g8wi7WiX #semiconductors #failureanalysis #sampleprotection #whitepaper
JIACO Instruments
Halfgeleiders
Delft, South Holland 716 volgers
Artifact-free decapsulation with atmospheric plasma
Over ons
JIACO Instruments MIP decapsulation system is a breakthrough innovation: Automated atmospheric pressure Microwave-Induced-Plasma (MIP) decapsulation utilising O2-only recipes. The system has been proven for Cu, PdCu, Au, Ag bond wires and for advanced package types like 3D, SiP, WLCSP, BOAC; all without process induced damage for reliable failure analysis and quality control. Our application range includes: - HAST, HTS, TMCL stressed Cu, PdCu, Au, Ag wire packages - Silver wire packages (new) - Wafer Level Chip Scale Package (WLCSP) (new) - High Tg mold compound (new) - Film Over Wire (FOW) (new) - Chip on Board (new) - Electrical Overstress (EOS) failure sites - Surface contamination and corrosion - Wedge bonds exposure - 3D stacked-die IC package - Gallium Arsenide (GaAs) and Gallium Nitride (GaN) devices (new) - System in Package (SiP) (new) - Localized decapsulation (new) - Sensors with transparent mold compound (new) - Bond Over Active Circuit (BOAC) with exposed copper metallization (new) - Redistribution Layer (RDL) with PBO and copper metallization (new) Other applications under R&D
- Website
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http://www.jiaco-instruments.com
Externe link voor JIACO Instruments
- Branche
- Halfgeleiders
- Bedrijfsgrootte
- 2-10 medewerkers
- Hoofdkantoor
- Delft, South Holland
- Type
- Particuliere onderneming
- Opgericht
- 2014
- Specialismen
- Plasma decapsulation systems, Advanced IC package decapsulation, Copper wire decapsulation, Thermally stressed package decapsulation, LED package decapsulation, 3D stacked die package decapsulation, Silver wire decapsulation, Copper wire decapsulation, SAW BAW filter decapsulation, SIP & module decapsulation, Ag, Cu, PdCu, Au wire decapsulation, O2 only plasma decapsulation, EOS exposure en Underfill , FOW, die attach etching
Locaties
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Primair
Routebeschrijving
Feldmannweg 17
Delft, South Holland 2628, NL
Medewerkers van JIACO Instruments
Updates
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𝗛𝗼𝘄 𝘁𝗼 𝗶𝗺𝗽𝗿𝗼𝘃𝗲 𝘆𝗼𝘂𝗿 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 𝗮𝗻𝗱 𝘀𝗮𝘃𝗲 𝗰𝗼𝘀𝘁𝘀 Our Microwave-Induced Plasma (MIP) machines don’t require specialized lab facilities, making them more cost-effective than acid decapsulation. Operate them in any location, even an office environment! Discover all the benefits of MIP technology by downloading our whitepaper: https://lnkd.in/gYXHY__K #semiconductors #failureanalysis #whitepaper
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𝟱 𝗿𝗲𝗮𝘀𝗼𝗻𝘀 𝘄𝗵𝘆 𝗲𝘃𝗲𝗿𝘆 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 𝘁𝗲𝗮𝗺 𝗻𝗲𝗲𝗱𝘀 𝗮 𝗠𝗜𝗣 𝗱𝗲𝗰𝗮𝗽𝘀𝘂𝗹𝗮𝘁𝗶𝗼𝗻 𝗺𝗮𝗰𝗵𝗶𝗻𝗲 Is your failure analysis team ready for the next-gen in semiconductor decapsulation? Discover 5 compelling reasons to switch to Microwave-Induced Plasma (MIP) technology. From precise etching to cost-effectiveness and automation, MIP machines outperform traditional methods in every way. Learn how MIP can transform your lab's efficiency and reliability. Read the full article here: https://lnkd.in/gyySgx7g #failureanalysis #semiconductors #mip
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Come to see us - booth 51, at #RADECS at the ExpoMeloneras to speak to us about how our artifact-free decapsulation process supports your radiation testing!
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𝗛𝗼𝘄 𝘁𝗼 𝘀𝘂𝗰𝗰𝗲𝗲𝗱 𝗮𝘁 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 Rapid and accurate failure analysis is vital for maintaining brand reputation and profitability. Time, cost and talent pressures mean you only have one chance to get it right. However, the standard decapsulation method of using acid risks destroying crucial evidence. An alternative, targeted decapsulation method, allows you to both preserve samples and meet deadlines. We have detailed the benefits of this method, using highly selective Microwave-Induced Plasma (MIP) technology, in our whitepaper: https://lnkd.in/gn3_dBsn #decapsulation #failureanalysis #reliabilitytest #whitepaper
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𝗘𝗻𝘀𝘂𝗿𝗲 𝘀𝗮𝗺𝗽𝗹𝗲 𝗽𝗿𝗼𝘁𝗲𝗰𝘁𝗶𝗼𝗻 𝗶𝗻 𝘆𝗼𝘂𝗿 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 In semiconductor manufacturing, timely and accurate failure analysis is crucial. With increasing complexity and reliance on semiconductors, there’s no room for error with precious samples. Major brands demand precise identification of failures, often within 48 hours. While acid decapsulation seems quick, it risks destroying critical evidence. Avoid jeopardizing your relationship with suppliers and brands by switching to a more targeted decapsulation solution. That solution is highly selective Microwave-Induced Plasma (MIP) technology. Find out more about the advantages of MIP technology in our whitepaper: https://lnkd.in/gu6j6uzU #decapsulation #failureanalysis #reliabilitytest #whitepaper
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Join JIACO Instruments at #RADECS in the Canary Islands from 16–20 Sept at booth 51 to learn how artifact-free Microwave Induced Plasma (MIP) decapsulation will assist you to accurately test your electronic devices after radiation testing
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𝗦𝗼𝗹𝘃𝗶𝗻𝗴 𝘁𝗮𝗹𝗲𝗻𝘁 𝗽𝗿𝗲𝘀𝘀𝘂𝗿𝗲𝘀 𝗼𝗳 𝘆𝗼𝘂𝗿 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 With a shortage of acid decapsulation specialists, Microwave-Induced Plamsa (MIP) technology enables more staff to make accurate analyses. Minimal interaction is required, reducing reliance on a few experts. Download our whitepaper to learn more about MIP technology: https://lnkd.in/exEanTxd #decapsulation #failureanalysis #labefficiency #whitepaper
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𝗚𝗮𝗶𝗻 𝗱𝗲𝗲𝗽𝗲𝗿 𝗶𝗻𝘀𝗶𝗴𝗵𝘁𝘀 𝗳𝗿𝗼𝗺 𝘆𝗼𝘂𝗿 𝗳𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 Beyond decapsulation, Microwave-Induced Plasma (MIP) technology reveals previously unknown failure mechanisms, enabling proactive problem-solving and true root cause anlaysis. Gain deeper insights than traditional acid testing allows. Discover all the benefits of MIP technology by downloading our whitepaper: https://lnkd.in/ekEpanWW #semiconductors #failureanalysis #decapsulation #whitepaper
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𝗙𝗮𝗶𝗹𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 𝗺𝗮𝗱𝗲 𝗲𝗮𝘀𝘆 Operating at atmospheric pressure, Microwave-Induced Plasma (MIP) technology avoids over-etching and plasma ion bombardment, unlike acid methods or other plasma processes. Safely analyze copper or silver elements of semiconductors without interference. Discover all the benefits of MIP technology by downloading our whitepaper: https://lnkd.in/e8jH2Dmd #semiconductors #failureanalysis #mip #whitepaper
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