Paper 2024/396

On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology

Theresa Krüger
Abstract

The possible effects of irradiation on security controllers implemented in CMOS technology are studied. First, the decrease of the effectiveness of a light sensor/detector as countermeasure against laser fault injection is analysed. Second, the use of irradiation as fault injection method is proposed.

Metadata
Available format(s)
PDF
Category
Implementation
Publication info
Preprint.
Keywords
irraditionsensor damagefault injectionattack potential
Contact author(s)
theresa krueger @ telekom de
History
2024-03-05: approved
2024-03-04: received
See all versions
Short URL
https://ia.cr/2024/396
License
Creative Commons Attribution
CC BY

BibTeX

@misc{cryptoeprint:2024/396,
      author = {Theresa Krüger},
      title = {On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in {CMOS} technology},
      howpublished = {Cryptology {ePrint} Archive, Paper 2024/396},
      year = {2024},
      url = {https://eprint.iacr.org/2024/396}
}
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